Can swift heavy ions create latent tracks in silicon?
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference48 articles.
1. Latent tracks formation in silicon single crystals irradiated with fullerenes in the electronic regime
2. Latent track formation in silicon irradiated by 30 MeV fullerenes
3. Tracks of high energy heavy ions in solids
4. SRIM – The stopping and range of ions in matter (2010)
5. Radiation damage formation in InP, InSb, GaAs, GaP, Ge, and Si due to fast ions
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1. Single-ion induced surface modifications on hydrogen-covered Si(001) surfaces—significant difference between slow highly charged and swift heavy ions;New Journal of Physics;2021-09-01
2. Insight into the dynamics of electrons ejected by energetic ions in silicon and its relation to the basics of the inelastic thermal spike model;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2018-10
3. Argon ion irradiation effect on Zn nanotubes;Journal of Materials Science: Materials in Electronics;2017-11-21
4. Swift heavy ion irradiation induced electrical degradation in deca-nanometer MOSFETs;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2016-09
5. Optical properties and surface damage studies of crystalline silicon caused by swift iron ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2016-05
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