Author:
Draxler M.,Zeppenfeld P.,Beikler R.,Taglauer E.,Bauer P.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
4 articles.
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1. Liquid Surfaces;Surface and Interface Science;2020-01-10
2. Sputter depth profiling of Mo/B4C/Si and Mo/Si multilayer nanostructures: A round-robin characterization by different techniques;Thin Solid Films;2013-07
3. Depth resolution enhancement by combined DSIMS and TOF-LEIS profiling;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2011-02
4. Effect of energy loss in the simulation of slow ion scattering by a solid surface;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2008-03