In situ analysis of cracks in structural materials using synchrotron X-ray tomography and diffraction-Reference-Cited by-同舟云学术

In situ analysis of cracks in structural materials using synchrotron X-ray tomography and diffraction

Published:2006-05 Issue:1 Volume:246 Page:217-225
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Steuwer A.,Edwards L.,Pratihar S.,Ganguly S.,Peel M.,Fitzpatrick M.E.,Marrow T.J.,Withers P.J.,Sinclair I.,Singh K.D.,Gao N.,Buslaps T.,Buffière J.-Y.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference19 articles.

1. Hard X-Ray Synchrotron Radiation Applications in Materials Science

2. Mesoscale Structural Characterization Within Bulk Materials by High-Energy X-Ray Microdiffraction

3. High spatial resolution grain orientation and strain mapping in thin films using polychromatic submicron x-ray diffraction

4. A review of crack closure, fatigue crack threshold and related phenomena

5. Fatigue crack propagation in aerospace aluminum alloys

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