Recent developments of material analysis with PIXE-Reference-Cited by-同舟云学术

Recent developments of material analysis with PIXE

Published:2005-10 Issue:1-2 Volume:240 Page:258-264
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Šmit Ž.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference31 articles.

1. B.L. Doyle, D.S. Walsh, P.G. Kotula, P. Rossi, T. Schülein, M. Rohde, The new annular Si drift detector μPIXE system at Sandia, in: Proc. 10th Int. Conf. PIXE its Anal. Appl., Portorož, 2004.

2. On the role of the signal processing electronics in X-ray analytical measurements

3. Review of experimental cross sections for K-shell ionization by light ions

4. Fitted empirical reference cross sections for K-shell ionization by protons

5. Fitted Empirical Reference Cross Sections for K-Shell Ionization by Alpha Particles

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