Use of a duoplasmatron ion source for negative ion generation-Reference-Cited by-同舟云学术

Use of a duoplasmatron ion source for negative ion generation

Published:2011-05 Issue:9 Volume:269 Page:1036-1040
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Pillatsch L.,Wirtz T.,Migeon H.-N.,Scherrer H.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference15 articles.

1. Manfred von Ardenne, in: Tabellen der Elektronenphysik, Ionenphysik und Übermikroskopie. Bd. 1. Hauptgebiete (VEB Dt. Verl. d. Wissenschaften), 1956.

2. A high brightness source for nano-probe secondary ion mass spectrometry;Smith;Appl. Surf. Sci.,2008

3. Electron attachment to molecules at low electron energies;Chutjian;Phys. Rep.,1996

4. Atomic negative ions: structure dynamics and collisions;Andersen;Phys. Rep.,2004

5. Handbook of Ion Sources;Wolf,1995

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A compact radio-frequency ion source for high brightness and low energy spread negative oxygen ion beam production;Review of Scientific Instruments;2023-09-01

2. Highest resolution chemical imaging based on secondary ion mass spectrometry performed on the helium ion microscope;Reports on Progress in Physics;2021-09-15

3. Negative ion sources;Journal of Applied Physics;2021-06-14

4. RF and Microwave Ion Sources Study at Institute of Modern Physics;Plasma;2021-06-06

5. An overview of NRL's NAUTILUS: a combination SIMS-AMS for spatially resolved trace isotope analysis;Journal of Analytical Atomic Spectrometry;2020