Use of micro-PIXE analysis for the identification of contaminants in the metal deposition on a CMS pitch adapter-Reference-Cited by-同舟云学术

Use of micro-PIXE analysis for the identification of contaminants in the metal deposition on a CMS pitch adapter

Published:2004-06 Issue: Volume:219-220 Page:722-726
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Massi M.,Giuntini L.,Fedi M.E.,Arilli C.,Grassi N.,Mandò P.A.,Migliori A.,Focardi E.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference8 articles.

1. The CMS Collaboration, The CMS Tracker Project Technical Design Report, CMS TDR 5 CERN/LHCC 98-6, 20 April 1998

2. http://web.iihe.ac.be/cms/pitchadapter/technicalspecification/it_3050_tech_spec_23_08.doc

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2. The external scanning proton microprobe of Firenze: A comprehensive description;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2007-06