Reliable ERD analysis of group-III nitrides despite severe nitrogen depletion
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference15 articles.
1. Group III nitride semiconductors for short wavelength light-emitting devices
2. Electron transport in wurtzite indium nitride
3. Hydrogen and Nitrogen Loss during ERD Analysis of Siliicon (Oxy)nitrides
4. Radiation damage during heavy ion elastic recoil detection analysis of insulating materials
5. Threshold stoichiometry for beam induced nitrogen depletion of SiN
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3. Tuning of the tetragonal distortion in AlInGaN thin films by different contents of Al and In;Superlattices and Microstructures;2014-09
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