Silver surface enrichment controlled by simultaneous RBS for reliable PIXE analysis of ancient coins-Reference-Cited by-同舟云学术

Silver surface enrichment controlled by simultaneous RBS for reliable PIXE analysis of ancient coins

Published:2008-05 Issue:10 Volume:266 Page:2320-2324
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Beck L.,Alloin E.,Berthier C.,Réveillon S.,Costa V.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference18 articles.

1. L.H. Cope, in: E.T. Hall, D.M. Metcalf (Eds.), Methods of Chemical and Metallurgical Investigation of Ancient Coinage, RNS Special Publication No. 8, 1972, p. 261.

2. Elemental analysis of Celtic coins

3. Is the external beam PIXE method suitable for determining ancient silver artifact fineness?

4. Silver surface enrichment of silver–copper alloys: a limitation for the analysis of ancient silver coins by surface techniques

Cited by 38 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Shedding light on the microstructure and chemical composition of rare early medieval coins from Italy (Berengario I) by combining pXRF and SEM–EDX analysis;Archaeological and Anthropological Sciences;2023-03

2. The Cleaning of Silver Objects With a Basic Solution of Sodium Glycinate: A Study on Artificially and Naturally Tarnished Silver;Studies in Conservation;2021-01-07

3. High-Accuracy 3D Optical Profilometry for Analysis of Surface Condition of Modern Circulated Coins;Materials;2020-11-26

4. Non-destructive identification of surface enrichment and trace element fractionation in ancient silver coins;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2020-09

5. Surface analysis of corroded XV–XVI century copper coins by μ-XRF and μ-PIXE/μ-EBS self-consistent analysis;Materials Characterization;2020-03