Confocal μ-XRF depth analysis of paint layers-Reference-Cited by-同舟云学术

Confocal μ-XRF depth analysis of paint layers

Published:2004-06 Issue: Volume:219-220 Page:35-40
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Šmit Ž.,Janssens K.,Proost K.,Langus I.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference5 articles.

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2. The monolithic X-ray polycapillary lens and its application in microbeam X-ray fluorescence

3. Paintings? a challenge for XRF and PIXE analysis

4. Upgrade of the x-ray fluorescence beamline at HASYLAB/DESY

5. K. Proost, K. Janssens, L. Vincze, G. Falkenberg, N. Gao, P. Bly, Feasibility and characteristics of confocal micro-XRF at Hasylab BL L, HASYLAB Annual Report 2002. http//www-hasylab.desy.de/science/annual_reports/2002_report/index.html

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