Existence of transient temperature spike induced by SHI: evidence by ion beam analysis-Reference-Cited by-同舟云学术

Existence of transient temperature spike induced by SHI: evidence by ion beam analysis

Published:2004-06 Issue: Volume:219-220 Page:206-214
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Avasthi D.K,Ghosh S,Srivastava S.K,Assmann W

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference37 articles.

2. Proceedings of international conference on `Plasma Surface Engineering', Edited by S. Berg, W. Moeller, K.-T. Rie, Elsevier Science B.V., 2001

3. Proceedings of International Conference on Ion Implantation, Nucl. Instr. and Meth. B 121 (1997)

4. Backscattering Spectrometry;Chu,1978

Cited by 40 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

3. Role of ion beams and their energies in the properties of zinc tin phosphide thin films;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2023-01