High-voltage scanning ion microscope: Beam optics and design-Reference-Cited by-同舟云学术

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High-voltage scanning ion microscope: Beam optics and design

Published:2015-05 Issue: Volume:350 Page:32-35
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Magilin D.,Ponomarev A.,Rebrov V.,Ponomarov A.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference12 articles.

1. High velocity ion microprobes and their source requirements;Legge;Rev. Sci. Instrum.,1996

2. From micro- to nanoprobes: auspices and horizons;Butz;Nucl. Instr. Meth. B,1996

3. Low-energy ion source characteristics for producing an ultra-fine microbeam;Ishii;Nucl. Instr. Meth. B,1996

4. Progress in submicron width ion beam system using double acceleration lenses;Ishii;Nucl. Instr. Meth. B,2003

5. Construction of a 300-keV compact ion microbeam system with a three-stage acceleration lens;Ishii;Nucl. Instr. Meth. B,2014

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Beam optics in nuclear microprobe: A review;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2021-06

2. Characterization Using Passive or Interactive Techniques;The Analysis of Nuclear Materials and Their Environments;2017

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