Applications of heavy ion microprobe for single event effects analysis

Author:

Reed Robert A.,Vizkelethy Gyorgy,Pellish Jonathan A.,Sierawski Brian,Warren Kevin M.,Porter Mark,Wilkinson Jeff,Marshall Paul W.,Niu Guofu,Cressler John D.,Schrimpf Ronald D.,Tipton Alan,Weller Robert A.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference9 articles.

1. Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices,2004

2. Microbeam studies of single-event effects;Sexton;IEEE Trans. Nucl. Sci.,1996

3. DESSIS Device Simulator, Synopsys Inc., 700 East Middlefield Road, Mountain View, CA 94043. .

4. Heavy-ion broad-beam and microprobe studies of single-event upsets in a 0.20μm SiGe heterojunction bipolar transistors and circuits;Reed;IEEE Trans. Nucl. Sci.,2003

5. Autonomous bit error rate testing at multi-Gbit/s rates implemented in a 5AM SiGe circuit for radiation effects self test (CREST);Marshall;IEEE Trans. Nucl. Sci.,2005

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