Structural and mechanical properties of Ar-ion irradiated YSZ single-crystals grown in different crystallographic orientations-Reference-Cited by-同舟云学术

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Structural and mechanical properties of Ar-ion irradiated YSZ single-crystals grown in different crystallographic orientations

Published:2017-10 Issue: Volume:409 Page:81-85
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Kurpaska L.,Frelek-Kozak M.,Nowakowska-Langier K.,Lesniak M.,Jasinski J.,Jagielski J.

Funder

Ministry of Science and Higher Education

Foundation for Polish Science

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference23 articles.

1. Mechanical properties of cubic zirconia irradiated with swift heavy ions

2. Nanoindentation study of irradiation and temperature effects in yttria-stabilized zirconia

3. A comparison between the irradiation damage response of spinel and zirconia due to Xe ion bombardment

4. Transformation of YSZ under high fluence argon ion implantation

5. Influence of low indentation load on Young's modulus and hardness of 4mol% Y2O3–ZrO2 by nanoindentation

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1. The microstructure and He+ ion irradiation behavior of novel low-activation W-Ta-Cr-V refractory high entropy alloy for nuclear applications;Nuclear Materials and Energy;2023-12

2. Microstructural modifications induced in Si⁺-implanted yttria-stabilised zirconia: a combined RBS-C, XRD and Raman investigation;Physical Chemistry Chemical Physics;2022

3. Irradiation response of Al2O3-ZrO2 ceramic composite under He ion irradiation;Journal of the European Ceramic Society;2021-04

4. Electro-chemo-mechanical effect in Gd-doped ceria thin films with a controlled orientation;Journal of Materials Chemistry A;2020

5. Bias voltage dependent structure and morphology evolution of magnetron sputtered YSZ thin film: a basic insight;Materials Research Express;2019-08-21

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