A procedure to correct for target thickness effects in heavy-ion PIXE at MeV energies

Author:

Zucchiatti Alessandro,Galán Patricia,Prieto José Emilio

Funder

MINECO

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference22 articles.

1. Time-of-flight MeV-SIMS with beam induced secondary electron trigger;Schulte-Borchers;Nucl. Instr. Meth.,2016

2. Development of ambient SIMS using mega-electron-volt-energy ion probe;Kusakari;J. Vacuum Sci. Tech.,2016

3. Molecular imaging of cannabis leaf tissue with MeV-SIMS method;Jencic;Nucl. Instr. Meth.,2016

4. Development of a TOF SIMS setup at the Zagreb heavy ion microbeam facility;Tadic;Nucl. Instr. Meth.,2014

5. Development of mass spectrometry by high energy focused heavy ion beam: MeV SIMS with 8 MeV Cl7+ beam;Jeromel;Nucl. Instr. Meth.,2014

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