Study the radiation damage effects in Si microstrip detectors for future HEP experiments-Reference-Cited by-同舟云学术

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Study the radiation damage effects in Si microstrip detectors for future HEP experiments

Published:2016-07 Issue: Volume:379 Page:262-264
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Lalwani Kavita,Jain Geetika,Dalal Ranjeet,Ranjan Kirti,Bhardwaj Ashutosh

Funder

MNIT Jaipur

Delhi University

Council of Scientific and Industrial Research

University Grant Commission

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference11 articles.

1. C.P. Nuttens, Overview of the CMS Strip and Pixel Detectors, PoS (Vertex 2013) 002.

2. Operation and performance of the ATLAS semiconductor tracker;JINST9,2014

3. Silicon sensor developments for the CMS tracker upgrade;Dierlamm;JINST,2012

4. A. Bhardwaj, Ranjeet Dalal, R. Eber, T. Peltola, T. Eichhorn, K. Lalwani, A. Messineo, M. Printz, K. Ranjan, Simulation of Silicon Devices for the CMS Phase II Tracker Upgrade, CMS DN-14-016.

5. A comprehensive numerical simulation of heavily irradiated p-type and n-type silicon detectors;Petasecca;IEEE Nucl. Sci. Symp. Conf. Rec.,2005

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