Surface erosion and modification by ions studied by computer simulation-Reference-Cited by-同舟云学术

Surface erosion and modification by ions studied by computer simulation

Published:2007-05 Issue:1 Volume:258 Page:172-177
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Insepov Z.,Norem J.,Swenson D.R.,Hassanein A.,Terasawa M.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference31 articles.

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4. A. Hamza, T. Schenkel, A. Barnes, D. Schneider, Highly-charged ion secondary mass spectroscopy, US Patent # 6,261,820 B1, September 18, 2001.

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