New program to estimate layer thicknesses from CEMS spectra
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference25 articles.
1. Applications of conversion electron Mössbauer spectrometry (CEMS)
2. Nanostructure of Vapor-Deposited 57Fe Thin Films
3. Icems and dcems study of Fe layers evaporated onto Al and Si
4. Surface magnetism
5. Ion implantation in semiconductors studied by Mössbauer spectroscopy
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