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X-ray production yield in standardized thick target PIXE

  • Published:2006-08 Issue:1-2 Volume:249 Page:792-795
  • ISSN:0168-583X
  • Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
  • language:en
  • Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Aburaya Jim Heiji,Added Nemitala,Tabacniks Manfredo Harri,de Almeida Rizzutto Márcia,Barbosa Marcel Dupret Lopes

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Improvements in the PIXE system of the CENTA laboratory with application in the contamination studies of tree rings in Slovakia;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2024-03

2. Multivariate analysis applied to particle-induced X-ray emission mapping;X-Ray Spectrometry;2018-06-17

3. Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2018-05

4. Thin and thick target PIXE analyses to assess the mechanism of Cu2+ removal by Egeria densa;Applied Radiation and Isotopes;2013-12

5. Assessment of metal sorption mechanisms by aquatic macrophytes using PIXE analysis;Journal of Hazardous Materials;2013-10
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