The next generation refrigerated (cryogenic) electron beam ion trap-source (REBIT-S)
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference11 articles.
1. Interaction of slow, very highly charged ions with surfaces
2. Production of high-charge-state thorium and uranium ions in an electron-beam ion trap
3. Observation of high electron emission yields following highly charged ion impact (up toTh75+) on surfaces
4. Light-emitting nanostructures formed by intense, ultrafast electronic excitation in silicon (100)
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Application of a metallic-magnetic calorimeter for high-resolution x-ray spectroscopy of Fe at an EBIT;Journal of Physics B: Atomic, Molecular and Optical Physics;2024-03-27
2. Effects of slow highly charged ion irradiation on metal oxide semiconductor capacitors;Journal of Vacuum Science & Technology B;2018-09
3. The new Stockholm Electron Beam Ion Trap (S-EBIT);Journal of Instrumentation;2010-12-09
4. Optimization of the Stockholm R-EBIT for production and extraction of highly charged ions;Journal of Instrumentation;2010-11-12
5. Room-temperature EBIS/T developments: past, present and future;Journal of Instrumentation;2010-11-09
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