Dynamic focusing of microprobe lens system during scanning process-Reference-Cited by-同舟云学术

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Dynamic focusing of microprobe lens system during scanning process

Published:2013-07 Issue: Volume:306 Page:21-24
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Melnik K.I.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference9 articles.

1. Development of wide range energy focused ion beam lithography system

2. PIXE and the nuclear microprobe: Tools for quantitative imaging of complex natural materials

3. The position of a scanner and its influence on the beam spot size in a nuclear microprobe

4. The Oxford submicron nuclear microscopy facility

5. Influence of the fringe field on moving of the charged particles in flat and cylindrical capacitors

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Beam optics of upgraded high energy heavy ion microbeam in Lanzhou;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2019-12

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