Cluster induced chemistry at solid surfaces: Molecular dynamics simulations of keV C60 bombardment of Si
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference26 articles.
1. Comparison of polyatomic and atomic primary beams for secondary ion mass spectrometry of organics
2. Secondary-ion yields from surfaces bombarded with keV molecular and cluster ions
3. View from the edge
4. A Comparison of Desorption Yields from C+60 to Atomic and Polyatomic Projectiles at keV Energies
5. The development of C60 and gold cluster ion guns for static SIMS analysis
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