Author:
Yamaguchi Y.,Watanabe G.,Fukuda Y.,Ageishi T.,Katayama T.,Ogawa T.,Uozumi Y.
Subject
Instrumentation,Nuclear and High Energy Physics
Reference37 articles.
1. Features of particle and heavy ion transport code system (PHITS) version 3.02;Sato;J. Nucl. Sci. Technol.,2018
2. Enhanced degradation in power MOSFET devices due to heavy ion irradiation;Felix;IEEE Trans. Nuclear Sci.,2007
3. Characterization of microdose damage caused by single heavy ion observed in trench type power MOSFETs;Kuboyama;IEEE Trans. Nuclear Sci.,2010
4. Biologic responses to low doses of ionizing radiation: Detriment versus hormesis;Feinendegen;J. Nucl. Med.,2001
5. Hormesis by low dose radiation effects: Low-dose cancer risk modeling must recognize up-regulation of protection;Feinendegen;Therapeutic Nuclear Med.,2012