Application of four-segments annular Silicon drift detector for 3-D surface topography reconstruction by micro-PIXE-Reference-Cited by-同舟云学术

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Application of four-segments annular Silicon drift detector for 3-D surface topography reconstruction by micro-PIXE

Published:2023-08 Issue: Volume:541 Page:205-215
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Hatam Ebrahim Gholami^ORCID,Pelicon Primož,Punzon-Quijorna Esther,Kelemen Mitja^ORCID,Vavpetič Primož,Pongrac Paula^ORCID

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference26 articles.

1. S.L. Molodtsov, A.F. Gurbich, C. Jeynes, Accurate ion beam analysis in the presence of surface roughness, J. Phys. D: Appl. Phys., 41 (2008) 205303. https://doi.org/10.1088/0022-3727/41/20/205303.

2. Computer simulation of RBS spectra from samples with surface roughness;Malinský;Nucl. Instrum. Methods Phys. Res., Sect. B,2016

3. Improved physics in SIMNRA 7;Mayer;Nucl. Instrum. Methods Phys. Res., Sect. B,2014

4. Possibilities and limitations of ERDA: examples from the ERDA ToF set-up at the Hahn-Meitner-Institut;Strub;Surf. Interface Anal.,2003

5. Effects of random surface roughness in pixe analysis of thick targets;Campbell;Nucl. Instrum. Methods Phys. Res., Sect. B,1985

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Nuclear instruments and methods in physics research section B: Beam interactions with materials and atoms;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2024-04

2. Three-dimensional Element-by-element Surface Topography Reconstruction of Compound Samples Using Multisegment Silicon Drift Detectors;Microscopy and Microanalysis;2023-11-07

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