Differential pulse polarographic determination of traces of phosphorus in semiconductor silicon
Author:
Publisher
Elsevier BV
Subject
Spectroscopy,Environmental Chemistry,Biochemistry,Analytical Chemistry
Reference19 articles.
1. Resistivity of Bulk Silicon and of Diffused Layers in Silicon
2. Phosphorus Isoconcentration Diffusion Studies in Silicon
3. Analyse du phosphore dans le silicium par reactions nucleaires
4. An automated radiochemical technique for measurement of impurity concentration profiles
5. The determination of traces of phosphorus in semiconductor silicon
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A RAPID AND SENSITIVE METHOD FOR THE FLUORIMETRIC DETERMINATION OF PHOSPHATE BY FLOW-INJECTION;Analytical Letters;2001-12-31
2. Anwendung elektrochemischer Analysenmethoden;Elektrochemische Analytik;1986
3. A radioreagent method for determination of traces of phosphorus in high-purity silicon;Journal of Radioanalytical and Nuclear Chemistry Articles;1985-07
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