1. S.M. Sze, VLSI Technology, 2nd Edition, McGraw-Hill, New York, 1988, Chapter 14.
2. A.V. Ferris-Prabhu, Introduction to Semiconductor Device Yield Modeling, ARTECH HOUSE, MA, 1992, Chapter 1.
3. C.Y. Chang, S.M. Sze, ULSI Technology, McGraw-Hill, New York, 1996.
4. A Survey of Iron Contamination in Silicon Substrates and Its Impact on Circuit Yield
5. Influence of Metal Impurities on Leakage Current of Si N+P Diode