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Microstructural examination of layered coatings by scanning electron microscopy, transmission electron microscopy, and atomic force microscopy

  • Published:1996-04 Issue:4-5 Volume:36 Page:213-223
  • ISSN:1044-5803
  • Container-title:Materials Characterization
  • language:en
  • Short-container-title:Materials Characterization

Author:

Rickerby D.G.,Friesen T.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference35 articles.

1. High-resolution electron microscopy study of X-ray multilayer structures;Petford-Long;J. Appl. Phys.,1987

2. The structure of ultra thin C/W and Si/W multilayers for high performance in soft X-ray optics;Ruterana;J. Appl. Phys.,1989

3. Magnetron sputtered boron films and Ti/B mutlilayer structures;Makowiecki;J. Vac. Sci. Technol.,1990

4. Microstructure and stability comparison of nanometre period W/C, WC/C and Ru/C multilayer structures;Nguyen,1990

5. Formation and morphology of InAs/GaAs heterointerfaces;Brandt;Phys. Res.,1992

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