Application of confocal laser scanning microscopy, atomic force microscopy, and the profilometric method in quantitative fractography-Reference-Cited by-同舟云学术

Application of confocal laser scanning microscopy, atomic force microscopy, and the profilometric method in quantitative fractography

Published:2001-02 Issue:2-3 Volume:46 Page:183-187
ISSN:1044-5803
Container-title:Materials Characterization
language:en
Short-container-title:Materials Characterization

Author:

Cwajna Jan,Roskosz Stanisław

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference10 articles.

1. Quantitative Tiefeninformationen aus Stereobildpaaren;Malkusch;Pract Metallogr,1991

2. Quantitative metallography and fractography of modern tool alloys;Cwajna;Proc Int Conf Quant Descr Mater Microstruct, Warszawa, April 16–19,1997

3. Electron microscopy in the investigations of wear and decohesion of tool alloys;Cwajna;Proc Int Conf Electron Microsc Solids, Kraków-Zakopane, May 6–9,1996

4. Szala J. Programme for profile analysis, profil v.2.01.

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