Digital Electron Microscopy on Advanced Materials-Reference-Cited by-同舟云学术

Digital Electron Microscopy on Advanced Materials

Published:2000-04 Issue:4-5 Volume:44 Page:375-384
ISSN:1044-5803
Container-title:Materials Characterization
language:en
Short-container-title:Materials Characterization

Author:

Shindo D,Ikematsu Y,Lim S.-H,Yonenaga I

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference30 articles.

1. High-Resolution Electron Microscopy for Materials Science;Shindo,1998

2. S. Senoussi: Etude d'um dispositif de filtrage des vitesses purement magnétique adaptable à un microscope électronique à très haute tension. Thése de 3e cycle, Univ. Paris-Orsay (1971).

3. The magnetic prism as an optical system;Castaing,1967

4. An imaging filter for biological applications;Krivanek;Ultramicroscopy,1995

5. Development of γ-type energy filtering TEM;Taya;J. Electron Microsc.,1996

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigation of Phosphorus In-Diffusion and Strain in GaAsP/GaAs Using High-Resolution Transmission Electron Microscopy;Journal of Nano Research;2020-04

2. Utility of Transmission Electron Microscopy in Small Round Cell Tumors;Journal of Pathology and Translational Medicine;2015-03-12

3. Microstructural investigation of Si-ion-irradiated single crystal 3C-SiC and SA-Tyrannohex SiC fiber-bonded composite at high temperatures;Journal of Nuclear Materials;2013-11

4. Characterization of Complex Thermal Barrier Deposits Pore Microstructures by a Combination of Imaging, Scattering, and Intrusion Techniques;Journal of Thermal Spray Technology;2009-07-25

5. Basic Principles of Analytical Electron Microscopy;Analytical Electron Microscopy for Materials Science;2002