1. Fine particles on semiconductor surfaces: sources, removal and impact on the semiconductor industry;Hoenig,1988
2. Ultrasonic and hydrodynamic techniques for particle removal from silicon wafers;Menon,1989
3. Electrophotography and Development Physics;Schein,1996
4. Xerography;Hays,1998
5. Charging macroscopic particles;Hendricks,1973