A dual-source nonlinear measurement system oriented to the empirical characterization of low-frequency dispersion in microwave electron devices-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

A dual-source nonlinear measurement system oriented to the empirical characterization of low-frequency dispersion in microwave electron devices

Published:2011-02 Issue:2 Volume:33 Page:165-175
ISSN:0920-5489
Container-title:Computer Standards & Interfaces
language:en
Short-container-title:Computer Standards & Interfaces

Author:

Raffo Antonio,Vadalà Valeria,Traverso Pier Andrea,Santarelli Alberto,Vannini Giorgio,Filicori Fabio

Publisher

Elsevier BV

Subject

Law,Hardware and Architecture,Software

Reference16 articles.

1. Accurate PHEMT nonlinear modeling in the presence of low-frequency dispersive effects;Raffo;IEEE Trans. Microwave Theory Tech.,2005

2. Modeling intermodulation distortion in GaAs MESFETs using pulsed I–V characteristics;Struble,1991

3. A temperature-dependent nonlinear analytic model for AlGaN–GaN HEMTs on SiC;Lee;IEEE Trans. Microwave Theory Tech.,2004

4. A frequency dispersion model of GaAs MESFET for large-signal applications;Jeon;IEEE Microwave Guided Wave Lett.,1997

5. Pulse measurements quantify dispersion in pHEMT's;Parker,1998

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Empowering GaN HEMT models: The gateway for power amplifier design;International Journal of Numerical Modelling: Electronic Networks, Devices and Fields;2015-11-25

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP