Quality assessment of chalcopyrite thin films using Raman spectroscopy

Author:

Rudigier Eveline,Alvarez-Garcia Jacobo,Luck Ilka,Klaer Jo,Scheer Roland

Publisher

Elsevier BV

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Reference14 articles.

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3. Thin-Film Solar Cells;Fuhs,1999

4. Compound polycrystalline solar cells: recent progress and Y2K perspective;Birkmire;Solar Energy Mater. Sol. Cells,2001

5. A. Ehlert, M. Kerstan, D. Helmreich, Method to identify and characterize crystal defects in monocrystalline semiconductor material; involves testing sample of monocrystalline semiconductor material using micro-Raman spectroscopy, Patent, DE19840197, 2000.

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