Electromigration in thin silver, copper, gold, indium, tin, lead and magnesium films
Author:
Publisher
Elsevier BV
Subject
Condensed Matter Physics,General Materials Science,General Chemistry
Reference29 articles.
1. ON THE DIRECTION OF ELECTROMIGRATION IN THIN SILVER, GOLD, AND COPPER FILMS
2. SOME OBSERVATIONS ON THE ELECTROMIGRATION IN ALUMINUM FILMS
3. ELECTROMIGRATION EFFECTS IN ALUMINUM FILM ON SILICON SUBSTRATES
4. Electromigration in Thin Al Films
5. RESISTANCE MONITORING AND EFFECTS OF NONADHESION DURING ELECTROMIGRATION IN ALUMINUM FILMS
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