A comprehensive study of enhanced characteristics with localized transition in interface-type vanadium-based devices-Reference-Cited by-同舟云学术

A comprehensive study of enhanced characteristics with localized transition in interface-type vanadium-based devices

Published:2020-06 Issue: Volume:13 Page:100201
ISSN:2542-5293
Container-title:Materials Today Physics
language:en
Short-container-title:Materials Today Physics

Author:

Lin C.-Y.,Chen P.-H.,Chang T.-C.,Huang W.-C.,Tan Y.-F.,Lin Y.-H.,Chen W.-C.,Lin C.-C.,Chang Y.-F.^ORCID,Chen Y.-C.^ORCID,Huang H.-C.,Ma X.-H.,Hao Y.,Sze S.M.

Funder

Ministry of Science and Technology, Taiwan,

Publisher

Elsevier BV

Subject

Physics and Astronomy (miscellaneous),Energy (miscellaneous),General Materials Science

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