Detection of slight crystal symmetry change accompanying DIGM in the CuZn system by convergent beam electron diffraction
Author:
Publisher
Elsevier BV
Subject
General Engineering
Reference23 articles.
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2. Diffusion Induced Grain Boundary Migration;Defect and Diffusion Forum;2007-11
3. Theories and observations of chemically induced interface migration;International Materials Reviews;1995-01
4. Diffusion induced grain boundary migration of symmetric and asymmetric 〈011〉 {011} tilt boundaries during the diffusion of Zn into Cu;Acta Metallurgica et Materialia;1992-05
5. Grain boundary migration initiated by diffusion;Russian Physics Journal;1992-05
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