On the index of Simon's congruence for piecewise testability-Reference-Cited by-同舟云学术

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On the index of Simon's congruence for piecewise testability

Published:2015-04 Issue:4 Volume:115 Page:515-519
ISSN:0020-0190
Container-title:Information Processing Letters
language:en
Short-container-title:Information Processing Letters

Author:

Karandikar P.,Kufleitner M.,Schnoebelen Ph.

Publisher

Elsevier BV

Subject

Computer Science Applications,Information Systems,Signal Processing,Theoretical Computer Science

Reference10 articles.

1. Piecewise testable events;Simon,1975

2. Subwords;Sakarovitch,1983

3. Varieties of Formal Languages;Pin,1986

4. A survey on small fragments of first-order logic over finite words;Diekert;Int. J. Found. Comput. Sci.,2008

5. Kernel methods for learning languages;Kontorovich;Theor. Comput. Sci.,2008

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1. On the 2-binomial complexity of the generalized Thue–Morse words;Theoretical Computer Science;2024-02

2. On the Piecewise Complexity of Words and Periodic Words;Lecture Notes in Computer Science;2024

3. Existential Definability over the Subword Ordering;Logical Methods in Computer Science;2023-12-21

4. Absent Subsequences in Words;Fundamenta Informaticae;2023-10-26

5. On Simon's congruence closure of a string;Theoretical Computer Science;2023-09

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