Study of Photoluminescence Decay by Time-correlated Single Photon Counting for the Determination of the Minority-carrier Lifetime in Silicon-Reference-Cited by-同舟云学术

Study of Photoluminescence Decay by Time-correlated Single Photon Counting for the Determination of the Minority-carrier Lifetime in Silicon

Published:2014 Issue: Volume:55 Page:121-127
ISSN:1876-6102
Container-title:Energy Procedia
language:en
Short-container-title:Energy Procedia

Author:

Parola Stéphanie,Daanoune Mehdi,Focsa Alexandru,Semmache Bachir,Picard Erwann,Kaminski-Cachopo Anne,Lemiti Mustapha,Blanc-Pélissier Danièle

Publisher

Elsevier BV

Reference13 articles.

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4. Dynamic photoluminescence lifetime imaging of multicrystalline silicon bricks;Herlufsen;Solar Energy Materials & Solar Cells,2012

5. Dynamic carrier lifetime imaging of silicon wafers using an infrared-camera approach;Ramspeck;Applied Physics Letters,2008

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