Author:
Rost Matthias,Stichtenoth Daniel,Meyer Karsten
Reference18 articles.
1. Rein S. Lifetime Spectroscopy - A Method of Defect Characterization in Silicon for Photovoltaic Applications. Springer, Berlin Heidelberg; 2005.
2. Roth T. Analysis of electrically active defects in silicon for solar cells, PhD. Thesis, University of Konstanz, Germany; 2008.
3. Rosenits P. Charakterisierung elektrisch aktiver Defekte in Silizium mittels Deep-Level Transient Spectroscopy und Lebensdauerspektroskopie. Diploma Thesis, University of Freiburg; 2007.
4. Istratov A A, Hieslmair H, Weber E R. Iron and its complexes in silicon. Appl. Phys. A A69, 13; 1999.
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