Researches and investigation on manufacturers’ reliability test data of electronic parts

Author:

Ruidong Dai,Chun Guo

Publisher

Elsevier BV

Reference13 articles.

1. T. Bedford and R. Cooke, Probabilistic risk analysis: foundations and methods, 2001.

2. Functional safety of electrical/electronic/programmable electronic safety-related systems,2010

3. Reliability prediction system based on the failure rate model for electronic components;Lee;Journal of Mechanical Science and Technology,2008

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5. "IEEE Standard Criteria for Safety Systems for Nuclear Power Generating Stations," in IEEE Std 603-1991, Institute of Electrical and Electronics Engineers, 1991.

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