A two-scale model for one-dimensional arrays of cantilevers and its verification-Reference-Cited by-同舟云学术

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A two-scale model for one-dimensional arrays of cantilevers and its verification

Published:2012-08 Issue:5 Volume:22 Page:538-543
ISSN:0957-4158
Container-title:Mechatronics
language:en
Short-container-title:Mechatronics

Author:

Hui Hui,Lenczner Michel,Pillet Emmanuel,Cogan Scott

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Computer Science Applications,Mechanical Engineering,Control and Systems Engineering

Reference12 articles.

1. Parallel dip-pen nanolithography with arrays of individually addressable cantilevers;Bullen;Appl Phys Lett,2004

2. Atomic force microscopy with patterned cantilevers and tip arrays: force measurements with chemical arrays;Green;Langmuir,2000

3. Atomic force microscope cantilever array for parallel lithography of quantum devices;Kakushima;Jpn J Appl Phys, Part 1: Reg Papers Short Notes Rev Papers,2004

4. Pzt cantilever array integrated with piezoresistor sensor for high speed parallel operation of afm;Kim;Sensors Actuators, A: Phys,2003

5. Vlsi-nems chip for parallel afm data storage;Despont;Sensors Actuators, A: Phys,2000

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. COMPUTER-AIDED DERIVATION OF MULTISCALE MODELS: A REWRITING FRAMEWORK;International Journal for Multiscale Computational Engineering;2014

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