Author:
Moore Steven I.,Yong Yuen K.,Omidbeike Meysam,Fleming Andrew J.
Subject
Electrical and Electronic Engineering,Computer Science Applications,Mechanical Engineering,Control and Systems Engineering
Reference56 articles.
1. Design, modeling and control of nanopositioning systems;Fleming,2014
2. Performance of sinusoidal scanning with MPC in AFM imaging;Rana;IEEE/ASME Trans Mechatronics,2015
3. Combining spiral scanning and internal model control for sequential AFM imaging at video rate;Bazaei;IEEE/ASME Trans Mechatronics,2016
4. Scanning probe microscopy;Salapaka;IEEE Control Syst,2008
5. Abramovitch DY, Andersson SB, Pao LY, Schitter G. A tutorial on the mechanisms, dynamics, and control of atomic force microscopes. In Proc. American control conference. New York City, NY; 2007, p. 3488–3502.
Cited by
10 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献