International telemicroscopy with a 3MV ultrahigh voltage electron microscope-Reference-Cited by-同舟云学术

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International telemicroscopy with a 3MV ultrahigh voltage electron microscope

Published:2000-05 Issue:1-2 Volume:83 Page:93-101
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Takaoka Akio,Yoshida Kiyokazu,Mori Hirotaro,Hayashi Soichiro,Young Stephen J.,Ellisman Mark H.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference33 articles.

1. Topics in in-situ experiments in the HVEM

2. Telemicroscopy

3. M.H. Ellisman, Proceedings of the 53rd Annual Meeting MSA, Kansas City, 1995, p. 66.

4. Optimization of thin-foil based phosphor screens for CCD imaging in TEM in the voltage range of 80–400 kV

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