Some aspects of image projection in the field-ion microscope
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference13 articles.
1. Application of a position‐sensitive detector to atom probe microanalysis
2. The tomographic atom probe: A quantitative three‐dimensional nanoanalytical instrument on an atomic scale
3. Concepts in atom probe designs
4. Improvements in three-dimensional atom probe design
5. Summary of discussion at the first workshop on three-dimensional atom-probe analysis — its present and future
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