Optimal experimental design of STEM measurement of atom column positions-Reference-Cited by-同舟云学术

Optimal experimental design of STEM measurement of atom column positions

Published:2002-04 Issue:4 Volume:90 Page:273-289
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Van Aert S.,den Dekker A.J.,Van Dyck D.,van den Bos A.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference26 articles.

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2. Scanning Transmission Electron Microscopy;Cowley,1997

3. The Theoretical Resolution Limit of the Electron Microscope

4. High-resolution Z-contrast imaging of crystals

5. Subangstrom Resolution by Underfocused Incoherent Transmission Electron Microscopy

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