Interpretation of unexpected rocking curve asymmetry in LACBED patterns of semiconductors
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference11 articles.
1. Radiation damage in ion-milled specimens: characteristics, effects and methods of damage limitation
2. Dose dependence of surface damage profiles for Ge(111) irradiated with 3 keV Ar+
3. TEM sample preparation by ion milling/amorphization
4. Transmission electron microscopy investigation of the damage produced in individual displacement cascades in GaAs and GaP
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3. Effect of sample bending on diffracted intensities observed in CBED patterns of plan view strained samples;Ultramicroscopy;2008-03
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