1. System reliability in the presence of common cause failures;Chae;IEEE Trans Reliab,1986
2. Burch R., Najm F., Yang P., Hocevar D. Pattern-independent current estimation for reliability analysis of CMOS circuits. In: Proceedings of the 25th ACM/IEEE design automation conference; 1988. p. 294–9.
3. Yang, K., Xue, J. Continuous state reliability analysis. In: Proceedings of the reliability and maintainability symposium. International symposium on product quality and integrity, annual; 1996. p. 251–7.
4. Computing method of reliability sensitivity under independent multi-failure mode;Zeng;Adv Mater. Res.,2011
5. Gamma processes and peaks-over-threshold distribution for time-dependent reliability;Noortwijk;Reliab Eng Syst Saf,2007