Predicting system failure rates of SRAM-based FPGA on-board processors in space radiation environments

Author:

Jung Seunghwa,Choi Jihwan P.

Publisher

Elsevier BV

Subject

Industrial and Manufacturing Engineering,Safety, Risk, Reliability and Quality

Reference38 articles.

1. Necessity of fault tolerance techniques in Xilinx kintex 7 FPGA devices for space missions: a case study;Van-Harten,2017

2. Radiation characteristics and SEU rates in NEqO environment using SPENVIS;Rahim,2016

3. Synchronization of faulty processors in coarse-grained TMR protected partially reconfigurable FPGA designs;Kretzschmar;Reliab Eng Syst Safe,2016

4. Radiation hardness assurance for the jem-euso space mission;Prieto-Alfonso;Reliab Eng Syst Safe,2015

5. Predicting on-orbit static single event upset rates in Xilinx Virtex FPAGs;Engel,2006

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