Subject
Industrial and Manufacturing Engineering,Safety, Risk, Reliability and Quality
Reference7 articles.
1. Paulsen J, Reed E, Kelley J. Reliability of tantalum polymer capacitors. In: Proceedings of CARTS Europe, 2004.
2. Limited failure population life tests, application to integrated circuit reliability;Meeker;Technometrics,1987
3. Bayesian calculation of cost optimal burn-in durations for mixed exponential populations;Perlstein;Reliab Eng Syst Saf,2001
4. Bayesian reliability analysis;Martz,1982
5. Bayesian estimation of life parameters in the Weibull distribution;Canavos;Oper Res,1973
Cited by
20 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献