Bayesian reliability modeling for masked system lifetime data-Reference-Cited by-同舟云学术

Bayesian reliability modeling for masked system lifetime data

Published:2000-04 Issue:3 Volume:47 Page:229-241
ISSN:0167-7152
Container-title:Statistics & Probability Letters
language:en
Short-container-title:Statistics & Probability Letters

Author:

Kuo Lynn,Yang Tae Young

Publisher

Elsevier BV

Subject

Statistics, Probability and Uncertainty,Statistics and Probability

Reference29 articles.

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5. Inference about defects in the presence of masking;Flehinger;Technometrics,1996

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