Inversion of temperature-dependent in situ ellipsometry constants of Au thin films
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference19 articles.
1. Exact ellipsometric measurement of thickness and optical properties of a thin light-absorbing film without auxiliary measurements
2. Parameter correlation and precision in multiple-angle ellipsometry
3. Optical analysis of thin gold films by combined reflection and transmission ellipsometry
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