Heavy-ion induced defects in phlogopite imaged by scanning force microscopy-Reference-Cited by-同舟云学术

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Heavy-ion induced defects in phlogopite imaged by scanning force microscopy

Published:2002-09 Issue: Volume:158-159 Page:439-443
ISSN:0257-8972
Container-title:Surface and Coatings Technology
language:en
Short-container-title:Surface and Coatings Technology

Author:

Lang M,Glasmacher U.A,Moine B,Müller C,Neumann R,Wagner G.A

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference8 articles.

1. W.H. Huang, M. Maurette, R.M. Walker, IAEA, Vienna, 1967; pub no. 4135, p. 415–429.

2. Doctoral Thesis, Universität Heidelberg;Gögen,1999

3. Alpha-recoil track dating of Quaternary volcanics

4. Diploma Thesis, Universität Heidelberg;von Grabczewski,2000

5. Fission-Track Dating;Wagner,1992

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3. Opto-structural and dielectric properties of 80 MeV oxygen ion irradiated natural phlogopite mica;NUCL INSTRUM METH B;2013

4. Scanning force microscopy of 129Iodine surface impact structures in muscovite, zircon and apatite as proxies for damage of simulated fission fragments in solids;Radiation Measurements;2013-04

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